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Quantifying Side-Channel Leakage in Public Metrology Releases

arXiv Security Archived Jun 03, 2026 ✓ Full text saved

arXiv:2606.02934v1 Announce Type: new Abstract: Public scientific and metrology releases can leak the hidden settings that produced them. We formalize and quantify this risk as a profiled statistical side-channel audit: a release map exposes finite-band statistics of a power spectral density (PSD), a profiled observer trains labeled template spectra under an explicit budget, and a challenge release is drawn from one of two utility-equivalent recipes separated by a protected coordinate. Averaged

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    Computer Science > Cryptography and Security [Submitted on 1 Jun 2026] Quantifying Side-Channel Leakage in Public Metrology Releases Faruk Alpay, Taylan Alpay Public scientific and metrology releases can leak the hidden settings that produced them. We formalize and quantify this risk as a profiled statistical side-channel audit: a release map exposes finite-band statistics of a power spectral density (PSD), a profiled observer trains labeled template spectra under an explicit budget, and a challenge release is drawn from one of two utility-equivalent recipes separated by a protected coordinate. Averaged PSD bins follow a gamma channel, replaced by a covariance-weighted log-spectrum channel when the bins are correlated; this yields exact Kullback-Leibler divergences, Chernoff exponents, protected-bit advantage bounds, and finite-training, finite-library, finite-compute, and model-mismatch corrections. Our headline result is a finite-band transport-leakage law: after amplitude and blur are eliminated, the protected acid-transport information obeys I_{\lambda|\alpha,\beta}(K) = (64/1225)\, w \lambda^{6} K^{9} + O(w \lambda^{8} K^{11}) for K\lambda \ll 1, a ninth-order exponent with a closed-form safe band. A step-by-step protocol turns a measured release into these numbers, and a fixed-seed reproducibility package regenerates every table and figure. We instantiate the audit on screened extreme-ultraviolet (EUV) roughness spectra as a model-conditioned case study, with deployment on measured releases the next step. Comments: 30 pages, 7 figures, 8 tables; ancillary reproducibility package included Subjects: Cryptography and Security (cs.CR); Information Theory (cs.IT) MSC classes: 94A60, 62B10, 62F03, 94A17, 60G35 Cite as: arXiv:2606.02934 [cs.CR]   (or arXiv:2606.02934v1 [cs.CR] for this version)   https://doi.org/10.48550/arXiv.2606.02934 Focus to learn more Submission history From: Taylan Alpay [view email] [v1] Mon, 1 Jun 2026 22:32:02 UTC (146 KB) Access Paper: view license Ancillary files (details): README.md checksums.sha256 data/digitized_psd_points.csv data/published_18nm_scale.csv data/synthetic_configurations.csv (58 additional files not shown) Current browse context: cs.CR < prev   |   next > new | recent | 2026-06 Change to browse by: cs cs.IT math math.IT References & Citations NASA ADS Google Scholar Semantic Scholar Export BibTeX Citation Bookmark Bibliographic Tools Bibliographic and Citation Tools Bibliographic Explorer Toggle Bibliographic Explorer (What is the Explorer?) Connected Papers Toggle Connected Papers (What is Connected Papers?) Litmaps Toggle Litmaps (What is Litmaps?) scite.ai Toggle scite Smart Citations (What are Smart Citations?) Code, Data, Media Demos Related Papers About arXivLabs Which authors of this paper are endorsers? | Disable MathJax (What is MathJax?)
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    arXiv Security
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    ◬ AI & Machine Learning
    Published
    Jun 03, 2026
    Archived
    Jun 03, 2026
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