Product-Aware Deep Autoencoders for Robust Process Monitoring in Multi-Product Cyber-Physical Systems

Computer Science > Artificial Intelligence [Submitted on 13 May 2026] Product-Aware Deep Autoencoders for Robust Process Monitoring in Multi-Product Cyber-Physical Systems MD Shafikul Islam, Jordan Carden As Industry 4.0 accelerates the integration of Cyber-Physical Systems (CPS) in manufacturing, robust anomaly detection has become critical for ensuring process safety and security. Current data-driven approaches typically employ "product-agnostic" or global models trained on the aggregate of all normal operating data. However, modern industrial facilities frequently operate under diverse product grades. While computationally simple, these global models inherently expand their decision boundaries to accommodate the variance of multiple modes, creating a "blind spot" where subtle anomalies or targeted cyber-physical attacks may be masked by the wide acceptance region of the model. In this work, we first demonstrate that the vulnerability described above is present in global-agnostic models operating across multiple product grades. We then present a Product-Aware Autoencoder as a principled mitigation that restricts the learning domain to grade-specific distributions. While this approach reduces the identified blind-spot risk, we do not claim it as the optimal mitigation among all possible alternatives. We rigorously validate this approach against a Global Agnostic baseline using the Extended Tennessee Eastman Process (TEP) benchmark. Our empirical results indicate that the Product-Aware framework performs comparably to the global baseline on standard detection metrics, while offering improved robustness to product-grade-specific operating modes. Most critically, stress tests simulating our hypothetical attack scenarios reveal that while the global model fails to detect operational deviations in 77.8% of the scenarios, the product-aware system achieves 100% detection accuracy. These findings suggest that, in flexible manufacturing environments, generalized anomaly detectors can pose non-trivial security risks, motivating a shift toward mode-aware diagnostic architectures. Subjects: Artificial Intelligence (cs.AI); Machine Learning (cs.LG) Cite as: arXiv:2606.00052 [cs.AI]   (or arXiv:2606.00052v1 [cs.AI] for this version)   https://doi.org/10.48550/arXiv.2606.00052 Focus to learn more Submission history From: MD Shafikul Islam [view email] [v1] Wed, 13 May 2026 23:24:32 UTC (5,050 KB) Access Paper: HTML (experimental) view license Current browse context: cs.AI < prev   |   next > new | recent | 2026-06 Change to browse by: cs cs.LG References & Citations NASA ADS Google Scholar Semantic Scholar Export BibTeX Citation Bookmark Bibliographic Tools Bibliographic and Citation Tools Bibliographic Explorer Toggle Bibliographic Explorer (What is the Explorer?) Connected Papers Toggle Connected Papers (What is Connected Papers?) Litmaps Toggle Litmaps (What is Litmaps?) scite.ai Toggle scite Smart Citations (What are Smart Citations?) Code, Data, Media Demos Related Papers About arXivLabs Which authors of this paper are endorsers? | Disable MathJax (What is MathJax?)