Detector error model for a circuit with post selections

Detector error model for a circuit with post selections Ask Question Asked today Modified today Viewed 4 times 0 Consider a circuit which has measurements which are used for post selection, i.e., at any time the measurements flip, the shot is discarded. Then, after this, the circuit also has measurements used for decoders, i.e., detectors. In this case, how can we construct the detector error model used for decoding? A typical circuit that has this structure is magic state cultivation. In one sense, I feel like an error before the post-selection measurements should not be accounted for an error mechanism for the detector error model because it does not flip the detectors. It is discarded. On the other hand, I also feel that with measurement errors on the post-selection measurements, such error can also affect the detector error model. Should errors before the post-selection measurements be also counted as error mechanism of subsequent detectors? In Stim, how can we get the right detector error model in this kind of situation? error-correctionstim Share Improve this question Follow asked 1 hour ago lan 3211 1 silver badge 7 7 bronze badges Add a comment Know someone who can answer? Share a link to this question via email, Twitter, or Facebook. Your Answer Sign up or log in Sign up using Google Sign up using Email and Password Post as a guest Name Email Required, but never shown Post Your Answer By clicking “Post Your Answer”, you agree to our terms of service and acknowledge you have read our privacy policy. Start asking to get answers Find the answer to your question by asking. Ask question Explore related questions error-correctionstim See similar questions with these tags. The Overflow Blog Open source for awkward robots Domain expertise still wanted: the latest trends in AI-assisted knowledge for... 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