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Tantalum-Encapsulated Niobium Superconducting Resonators: High Internal Quality Factor and Improved Temporal Stability via Surface Passivation

arXiv Quantum Archived Apr 13, 2026 ✓ Full text saved

arXiv:2604.09050v1 Announce Type: new Abstract: Superconducting coplanar waveguide resonators are essential components in quantum processors, where their internal quality factor (Qi) constrains qubit coherence and readout fidelity. In niobium devices, microwave losses at millikelvin temperatures are strongly influenced by two-level systems (TLS) associated with the complex NbOx surface oxide. To mitigate these losses, we investigate a surface-engineering approach in which Nb films are capped in

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    Quantum Physics [Submitted on 10 Apr 2026] Tantalum-Encapsulated Niobium Superconducting Resonators: High Internal Quality Factor and Improved Temporal Stability via Surface Passivation Anas Alkhazaleh, Juan Villegas, Florent Ravaux, Alexey Zharinov Superconducting coplanar waveguide resonators are essential components in quantum processors, where their internal quality factor (Qi) constrains qubit coherence and readout fidelity. In niobium devices, microwave losses at millikelvin temperatures are strongly influenced by two-level systems (TLS) associated with the complex NbOx surface oxide. To mitigate these losses, we investigate a surface-engineering approach in which Nb films are capped in situ with a thin tantalum layer to suppress Nb2O5 formation and replace the native NbOx interface with a Ta-based oxide. We fabricate Nb/Ta bilayer and reference Nb resonators on high-resistivity silicon using identical DC sputtering and wet etching conditions, and characterize their performance at millikelvin temperatures. Fresh Ta-encapsulated devices exhibit internal quality factors up to 2.4 x 10^6 in the near-single-photon regime, with power dependence consistent with reduced TLS-related loss at the metal-air interface. A control Nb device fabricated under the same process shows comparatively lower Q_TLS, consistent with the beneficial effect of the Ta capping layer. Furthermore, ageing tests performed on Nb/Ta resonators after six months reveal a moderate reduction in Q_TLS relative to their initial values, yet the performance remains superior to newly fabricated Nb-only devices. These results suggest that thin Ta encapsulation enhances interface quality and contributes to improved temporal stability while remaining compatible with Nb-based fabrication workflows. Comments: 11 pages, 14 figures Subjects: Quantum Physics (quant-ph); Materials Science (cond-mat.mtrl-sci) Cite as: arXiv:2604.09050 [quant-ph]   (or arXiv:2604.09050v1 [quant-ph] for this version)   https://doi.org/10.48550/arXiv.2604.09050 Focus to learn more Submission history From: Anas Alkhazaleh [view email] [v1] Fri, 10 Apr 2026 07:24:10 UTC (8,991 KB) Access Paper: HTML (experimental) view license Current browse context: quant-ph < prev   |   next > new | recent | 2026-04 Change to browse by: cond-mat cond-mat.mtrl-sci References & Citations INSPIRE HEP NASA ADS Google Scholar Semantic Scholar Export BibTeX Citation Bookmark Bibliographic Tools Bibliographic and Citation Tools Bibliographic Explorer Toggle Bibliographic Explorer (What is the Explorer?) Connected Papers Toggle Connected Papers (What is Connected Papers?) Litmaps Toggle Litmaps (What is Litmaps?) scite.ai Toggle scite Smart Citations (What are Smart Citations?) Code, Data, Media Demos Related Papers About arXivLabs Which authors of this paper are endorsers? | Disable MathJax (What is MathJax?)
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    arXiv Quantum
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    ◌ Quantum Computing
    Published
    Apr 13, 2026
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    Apr 13, 2026
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